Influence of annealing temperature on the structural, morphological and optical properties of Cu doped ZnO thin films deposited by the sol–gel method
No Thumbnail Available
Date
2014
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
In this work, the characteristics of 5 wt% Cu doped ZnO thin films
deposited by sol gel on glass substrates were studied. The objective
of the present work is to study the influence of different annealing
temperatures on the structural, morphological and optical properties
of 5 wt% Cu doped ZnO thin films. For this purpose we have
used XRD, AFM and UV–visible spectroscopy for films characterization.
Structural analysis showed that all films are polycrystalline
with hexagonal wurtzite structure and preferred orientation
(002) which gradually improves with increasing the annealing
temperature. The grain size is calculated by the Scherrer method
ranges from 21.65 nm to 36.47 nm. The AFM study showed an
increase in surface roughness with increasing annealing temperature.
Optical characterization in the visible range from 300 to
1100 nm showed that the deposited layers have a high transmission
factor (>78%). The calculated gaps vary between 3.28 and
3.36 eV in the whole investigated annealing temperature range